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62-layer ATE load PCB board - UGPCB

Semiconductor Test PCB/

62-layer ATE load PCB board

Number of layers: 62 layers
Size: 16.9" × 22.9"
Thickness: 250 mil
PCB material: FR4 HTg
Minimum hole diameter: 8 mil
BGA pitch: 0.65mm
Aspect ratio: 32:1
Drilling to metal layer: 7 mil
POFV: Yes
Back drilling: Yes
Surface finish: ENEG

  • Product Details

Overview of the 62-Layer ATE Load PCB

The 62-Layer ATE Load PCB is a high-performance, ultra-high-density printed circuit board engineered for Automated Test Equipment (ATE) systems. Designed to handle complex signal routing and high-power loads, it meets rigorous testing requirements in semiconductor manufacturing and advanced electronics validation.

Key Definition

An ATE Load PCB is a specialized circuit board that simulates real-world operating conditions for testing integrated circuits (ICs) and electronic components. The 62-layer configuration supports intricate signal paths, power distribution, and thermal management in compact designs.

Critical Design Parameters

  • Layer Count: 62 layers for multi-domain signal isolation and power plane optimization.

  • Dimensions: 16.9″ × 22.9″ (large format for multi-device integration).

  • Thickness: 250 mil (balances rigidity and thermal dissipation).

  • Material: FR4 HTg (high-temperature glass epoxy for stability up to 180°C).

  • Minimum Hole Size: 8 mil (supports high-density interconnects).

  • BGA Pitch: 0.65mm (enables fine-pitch component mounting).

  • Aspect Ratio: 32:1 (ensures reliable plating in microvias).

  • Drill-to-Copper: 7 mil (prevents short circuits).

  • POFV & Back-Drilling: Eliminates signal distortion in high-frequency applications.

  • Surface Finish: ENEG (Electroless Nickel Electroless Gold for corrosion resistance).

Core Functionality

The PCB routes test signals between ATE systems and devices under test (DUTs), ensuring accurate voltage/current measurements. Back-drilling removes unused via stubs to minimize signal reflections, while POFV (Plated Over Filled Vias) enhances thermal conductivity and structural integrity.

Primary Applications

  • Semiconductor Testing: Validates ICs, CPUs, and memory modules.

  • Aerospace & Defense: Mission-critical avionics and radar systems.

  • Telecom Infrastructure: High-speed data transmission equipment.

  • Medical Devices: Precision diagnostic and imaging tools.

Material Advantages

FR4 HTg provides:

  • Thermal Resilience: Stable performance under cyclic thermal stress.

  • Low Dielectric Loss: Critical for high-frequency signal integrity.

  • Mechanical Strength: Resists warping during multilayer lamination.

Structural Features

  • Hybrid Stackup: Combines high-speed, power, and ground layers.

  • Microvia Technology: Laser-drilled microvias (8 mil) enable dense interlayer connections.

  • Controlled Impedance Traces: Minimizes crosstalk in 0.65mm BGA layouts.

Performance Highlights

  • Signal Integrity: <3% insertion loss at 10 GHz.

  • Power Handling: Supports 20A per power plane.

  • Thermal Management: 1.2 W/mK thermal conductivity via POFV.

Manufacturing Workflow

  1. Material Prep: Cut FR4 HTg cores and prepreg sheets.

  2. Laser Drilling: Create 8-mil microvias with ±1 mil tolerance.

  3. Plating & POFV: Electroplate vias and fill with conductive epoxy.

  4. Back-Drilling: Remove excess via stubs using depth-controlled drills.

  5. Lamination: Press 62 layers under high temperature/pressure.

  6. Surface Finish: Apply ENEG for solderability and oxidation resistance.

  7. Testing: Validate impedance, continuity, and thermal cycling.

Ideal Use Cases

  • High-Frequency ATE Systems: Tests 5G RF components and millimeter-wave devices.

  • Multi-Site Testing: Parallel validation of 16+ DUTs on a single board.

  • Harsh Environments: Oil/gas exploration sensors and automotive ECU testing.

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